Contracted imaging with an electron microscope.
Surprising price starting from 15,750 yen - Contracted imaging with an electron microscope.
We have started offering "contract electron microscope imaging" using the scanning electron microscope installed in our company. When you send us your samples, we will create a sample holder, capture images, and convert them into image files (jpeg) before sending them back to you. We have set very affordable rates, so please take advantage of this service. 【Main Equipment】 Equipment: Scanning Electron Microscope (FE-SEM) Model: S-4000 (Hitachi) Magnification: ×100 to 300,000 times (guaranteed range up to 100,000) Sample holder size: 15mm (diameter) Acceleration voltage: 0.5 to 30 kV Overview of the equipment: By irradiating the sample surface with an electron beam and detecting the backscattered electrons from the sample surface, we can observe the shape of the sample surface. Measurement: Backscattered electron image
- 企業：エマオス京都
- 価格：Other
